The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Oct. 04, 2019
Applicant:

Palo Alto Research Center Incorporated, Palo Alto, CA (US);

Inventor:

Deokwoo Jung, Mountain View, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06N 3/042 (2023.01); G06N 3/08 (2023.01); G06N 3/045 (2023.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06N 3/042 (2023.01); G06N 3/045 (2023.01); G06N 3/08 (2013.01); G06N 7/01 (2023.01); G06N 20/00 (2019.01);
Abstract

One embodiment can provide a system for detecting anomaly for high-dimensional sensor data associated with one or more machines. During operation, the system can obtain sensor data from a set of sensor associated with one or machines, generate a first set of outputs by using a set of clustering models learned in parallel from the unlabeled sensor data and user-provided partial label information, generate a second set of outputs by using a set of feed-forward neural network (FNN) models learned in parallel from the first set of outputs and the unlabeled sensor data, and determine whether an anomaly is present in the operation of the one or more machines based on the second set of outputs and a user-specified threshold.


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