The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Feb. 23, 2022
Applicant:

The Dtx Company, New York, NY (US);

Inventors:

Patrik Andrew Devlin, New York, NY (US);

Neil Wayne Cohen, Oakton, VA (US);

Corey Benjamin Daugherty, Barrington, RI (US);

Jack Armstrong, Greenwich, CT (US);

Andrew Duplessie, New York, NY (US);

Alex Rogers, Greenwich, CT (US);

Assignee:

the dtx company, New York, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04W 4/80 (2018.01); G06K 19/07 (2006.01); G06K 7/10 (2006.01); G06K 19/077 (2006.01);
U.S. Cl.
CPC ...
G06K 19/0723 (2013.01); G06K 7/10366 (2013.01); G06K 19/0776 (2013.01); H04W 4/80 (2018.02);
Abstract

This disclosure relates to an electronic tag that may be scanned using at least two modalities, such by scanning a radio-frequency identification ('RFID') embedded within the tag and/or scanning a machine-readable label ('MRL') visible from an outside of the tag. Systems may track and capture downstream user interaction with content presented in response to a scan. Systems may distinguish between scan of an MRL versus scans of an RFID chip. A scan of an MRL may trigger loading of a first scan destination on a scanning device. A scan of an RFID chip may trigger loading of a second scan destination on a scanning device. Systems may generate analytics on detected differences between whether an MRL or RFID chip is scanned.


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