The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Feb. 25, 2021
Applicants:

Kabushiki Kaisha Toshiba, Tokyo, JP;

Toshiba Energy Systems & Solutions Corporation, Kawasaki, JP;

Inventors:

Yasunori Taguchi, Kawasaki Kanagawa, JP;

Kouta Nakata, Kawasaki Kanagawa, JP;

Susumu Naito, Kawasaki Kanagawa, JP;

Yuichi Kato, Kawasaki Kanagawa, JP;

Toshio Aoki, Yokohama Kanagawa, JP;

Shinya Tominaga, Yokohama Kanagawa, JP;

Isaku Nagura, Yokohama Kanagawa, JP;

Ryota Miyake, Yokohama Kanagawa, JP;

Chikashi Miyamoto, Yokohama Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G05B 19/418 (2006.01); G06N 20/00 (2019.01); G06F 17/18 (2006.01);
U.S. Cl.
CPC ...
G05B 19/4183 (2013.01); G06F 17/18 (2013.01); G06N 20/00 (2019.01);
Abstract

According to an embodiment, a monitoring apparatus configured to generate time-series predicted data based on time-series measured data and a prediction model that generates predicted data including one or more predicted values predicted to be output from one or more sensors; and generate, for a first sensor among the one or more sensors, a displayed image including a measured value graph representing a temporal change in a measured value included in the time-series measured data in a second period after a first period, a predicted value graph representing a temporal change in a predicted value included in time-series predicted data in the second period, past distribution information representing a distribution of a measured value in the first period, and measurement distribution information representing a distribution of the measured value included in the time-series measured data in the second period.


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