The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Aug. 28, 2019
Applicant:
Etaluma, Inc., Carlsbad, CA (US);
Inventors:
Chris Shumate, Carlsbad, CA (US);
Robert K. Levin, San Diego, CA (US);
Eric Weiner, San Diego, CA (US);
Assignee:
ETALUMA, INC., Carlsbad, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01); G02B 21/06 (2006.01); G02B 21/14 (2006.01); G02B 21/26 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/14 (2013.01); G02B 21/26 (2013.01); G02B 21/361 (2013.01);
Abstract
Microscope imaging and illumination systems and methods are included that may be used to image multiple specimens at different locations relative to a specimen fixture without the need for repositioning a source of illumination. In some cases, light patterns emitted from illumination screens may be repositioned and reconfigured electronically as needed with an illumination signal communicated to such illumination screens. Specialized microscope imaging techniques such as phase contrast microscopy may also be used with the systems and methods discussed herein.