The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
May. 27, 2020
Qualcomm Incorporated, San Diego, CA (US);
Volodimir Slobodyanyuk, San Diego, CA (US);
Roberto Rimini, San Diego, CA (US);
Udara Fernando, San Diego, CA (US);
Nitin Jonathan Myers, Austin, TX (US);
Vijay Varadarajan, La Jolla, CA (US);
QUALCOMM Incorporated, San Diego, CA (US);
Abstract
Methods, systems, computer-readable media, and apparatuses for determining one or more attributes of at least one target based on eigenspace analysis of radar signals are presented. In some embodiments, a subset of eigenvectors to use for forming a signal or noise subspace is identified based on principal component analysis. In some embodiments, the subset of eigenvectors is identified based on estimating the total number of targets using a discrete Fourier transform (DFT) or other spectral analysis technique. In some embodiments, a DFT is used to identify areas of interest in which to perform eigenspace analysis. In some embodiments, a DFT is used to estimate one attribute of a target, and eigenspace analysis is performed to estimate a different attribute of the target, with the results being combined to generate a multi-dimensional representation of a field of view.