The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Mar. 20, 2018
Apple Inc., Cupertino, CA (US);
Oleg Naroditsky, San Francisco, CA (US);
Kuen-Han Lin, Mountain View, CA (US);
Dimitrios Kottas, Sunnyvale, CA (US);
Apple Inc., Cupertino, CA (US);
Abstract
Systems, methods, and computer readable media to track and estimate the accuracy of a visual inertial odometry (VIO) system. Various embodiments are able to receive one or more VIO feature measurements associated with a set of image frames from a VIO system and generate a plurality of feature models to estimate health values for the VIO system. The various embodiments determine a plurality of feature health values with the feature models based on the VIO feature measurements and compare the feature health values with ground truth health scores associated with the set of image frames to determine one or more errors. The feature model parameters are updated based on the comparison with the feature health values with ground truth health scores.