The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Nov. 29, 2018
Hitachi High-tech Corporation, Tokyo, JP;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Yuichiro Ota, Tokyo, JP;
Takaaki Hagiwara, Tokyo, JP;
Yoshihiro Yamashita, Tokyo, JP;
Koshin Hamasaki, Tokyo, JP;
Michaela Windfuhr, Mannheim, DE;
Heike Guggemos, Mannheim, DE;
Johannes Stoeckel, Mannheim, DE;
Guenter Ziegler, Mannheim, DE;
Michael Kuehnl, Mannheim, DE;
Hitachi High-Tech Corporation, Tokyo, JP;
Roche Diagnostics Operations, Inc., Indianapolis, IN (US);
Abstract
The object of the invention is to provide an automatic analysis apparatus capable of setting a dispensing mechanism for measuring dispensing accuracy and a dispensing volume, and capable of performing dispensing accuracy measurement without absorbance measurement. Regarding a dispensing accuracy, a dispensing mechanism to be measured is designated. Parameters including a dispensing volume and the like are input. A dispensing operation of the input dispensing volume is automatically performed for each designated dispensing mechanism. A reaction vessel contains, for example, a reagent of the input dispensing volume which has been dispensed by the designated dispensing mechanism. By measuring a weight of the reagent in the reaction vessel, or the like, it is possible to measure the dispensing accuracy of the designated dispensing mechanism.