The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Jan. 06, 2021
Applicant:

Dell Products, Lp, Round Rock, TX (US);

Inventors:

James D. Trim, Pflugerville, TX (US);

Jace W. Files, Round Rock, TX (US);

John T. Morrison, Round Rock, TX (US);

Sajjad Ahmed, Austin, TX (US);

Assignee:

Dell Products L.P., Round Rock, TX (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 16/245 (2019.01); G06F 16/29 (2019.01); G01N 33/00 (2006.01); G05B 15/02 (2006.01); G06N 5/04 (2023.01);
U.S. Cl.
CPC ...
G01N 33/0063 (2013.01); G05B 15/02 (2013.01); G06F 16/245 (2019.01); G06F 16/29 (2019.01); G06N 5/04 (2013.01); G01N 33/004 (2013.01); G01N 33/0047 (2013.01); G01N 2033/0068 (2013.01);
Abstract

A sensor measures an environmental factor in an ambient environment immediately surrounding an information handling system. A processor determines that the information handling system is in a first location, provides a first sampling frequency of the sensor based upon the first location, determines that the information handling system is in a second location, and provides a second sampling frequency of the sensor based upon the second location. The first sampling frequency is different from the second sampling frequency.


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