The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Feb. 07, 2017
Applicant:

Grabner Instruments Messtechnik Gmbh, Vienna, AT;

Inventor:

Josef Lutz, Rohrau, AT;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 25/52 (2006.01); H01L 23/38 (2006.01); F25B 21/02 (2006.01); G01N 25/50 (2006.01); F28D 20/02 (2006.01); F28F 13/00 (2006.01);
U.S. Cl.
CPC ...
G01N 25/52 (2013.01); F25B 21/02 (2013.01); G01N 25/50 (2013.01); H01L 23/38 (2013.01); F25B 2321/0251 (2013.01); F28D 20/02 (2013.01); F28F 2013/008 (2013.01);
Abstract

In a device for controlling the temperature of a test sample in a measuring device for measuring material properties of the test sample, comprising a measuring cell for receiving the test sample, at least one temperature controlling element, and a thermal storage element coupled to the temperature controlling element to transfer heat, wherein means are provided for changing the thermal resistance between the thermal storage element and the measuring cell in order to selectively couple or decouple the thermal storage element and the measuring cell in terms of heat transfer, the ratio of the thermal capacity of the thermal storage element to the thermal capacity of the measuring cell is greater than 1:1, preferably at least 2:1, preferably at least 5:1.


Find Patent Forward Citations

Loading…