The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Mar. 01, 2021
Shimadzu Corporation, Kyoto, JP;
Kenji Sato, Kyoto, JP;
Shimadzu Corporation, Kyoto, JP;
Abstract
Provided is an X-ray analysis device and an X-ray analysis method capable of easily analyzing a valence of a target element in a sample. A controllerof a signal processing device of the X-ray analysis device is provided with: a storage unitfor storing a calibration curve generated based on a peak energy of KαX-ray and a peak energy of KαX-ray emitted from a metal simple substance, a peak energy of KαX-ray and a peak energy of KαX-ray emitted from each of two or more types of compounds each containing the metal simple substance, and a valence of the metal in each of the two or more types of compounds; a processing unitconfigured to acquire a peak energy of KαX-ray and a peak energy of KαX-ray of the metal emitted from the metal contained in an unknown sample; and a calculation unitconfigured to calculate a mean valence of the metal contained in the unknown sample by applying the obtained peak energy of KαX-ray and peak energy of KαX-ray to the calibration curve.