The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Oct. 29, 2018
Applicant:

Shimadzu Corporation, Kyoto, JP;

Inventor:

Tohru Matsuura, Kyoto, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/06 (2006.01); G01N 3/08 (2006.01);
U.S. Cl.
CPC ...
G01N 3/06 (2013.01); G01N 3/08 (2013.01); G01N 3/066 (2013.01); G01N 2203/0017 (2013.01); G01N 2203/0218 (2013.01); G01N 2203/0617 (2013.01); G01N 2203/0635 (2013.01); G01N 2203/0682 (2013.01);
Abstract

A material testing machine is provided. The material testing machine includes a force detector that detects the testing force that acts on the target to be tested; a displacement detector that detects displacement generated in the target to be tested; and a controller that controls the load mechanism. The controller includes: a differential displacement calculator that obtains a differential displacement value from a value of the displacement detected by the displacement detector and a target displacement value that has been set in advance as a test condition; and a display controller that displays, on a display device, a differential displacement graph indicating, in a form of a graph, time-series data of the differential displacement value calculated by the differential displacement calculator.


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