The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Sep. 22, 2021
11887041 Canada Ltd., Winnipeg, CA;
David Allan Prystupa, Pinawa, CA;
John Stephen Pacak, Winnipeg, CA;
11887041 Canada Ltd., Winnipeg, CA;
Abstract
A method for measuring a property of radiation from different sources such as moving particles or different spatial locations on each particle includes providing a spatial modulator common to all of the sources having a sequence of configurations, each of which configurations causes the radiation flux to pass along paths to respective modulation ports and cycling the common spatial modulator past each of the modulation ports so that the sequence of configurations is applied to each modulation port. The sequence of configurations comprises an ordered array of optical elements on a substrate. In one embodiment, the modulator is arranged in a circle around an axis of rotation of a rotating singulation disk. At least one source is a reference source which has not interacted with the source to be analyzed and the sample and reference sources are compared.