The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Jul. 21, 2020
Applicant:

Argo Ai, Llc, Pittsburgh, PA (US);

Inventor:

Casey J. Sennott, Pittsburgh, PA (US);

Assignee:

ARGO AI, LLC, Pittsburgh, PA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 17/00 (2006.01); G01B 21/00 (2006.01); G01S 7/497 (2006.01);
U.S. Cl.
CPC ...
G01B 17/00 (2013.01); G01B 21/00 (2013.01); G01S 7/4972 (2013.01);
Abstract

Devices, systems, and methods are provided for enhanced sensor alignment. A device may determine a first array of displacement sensors proximate to a first test structure. The device may determine a second array of displacement sensors proximate to a second test structure. The device may apply a test condition to the first array, the second array, the first test structure, and the second test structure. The device may collect a first output from applying the test condition to the first test structure. The device may collect a second output from applying the test condition to the second test structure. The device may generate a first deviation vector associated with the first output. The device may generate a second deviation vector associated with the second output. The device may determine a first design status of the first structure based on the first deviation vector. The device may determine a second design status of the second structure based on the second deviation vector.


Find Patent Forward Citations

Sennott, Casey. (2023). Enhanced sensor alignment (U.S. Patent No. 11740078). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11740078

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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