The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Aug. 20, 2019
Applicant:

Jx Nippon Mining & Metals Corporation, Tokyo, JP;

Inventor:

Kenta Tsujie, Kanagawa, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C22C 9/00 (2006.01); C21D 9/02 (2006.01); C22F 1/08 (2006.01); G03B 3/10 (2021.01);
U.S. Cl.
CPC ...
C22C 9/00 (2013.01); C21D 9/02 (2013.01); C22F 1/08 (2013.01); G03B 3/10 (2013.01);
Abstract

Provided is a titanium copper foil which has required high strength when used as a spring, has an improved etching property, and has decreased settling, and which can be suitably used as a conductive spring material for use in electronic device parts such as autofocus camera modules. The titanium copper foil according to the present invention contains from 1.5 to 5.0% by mass of Ti, the balance being Cu and inevitable impurities, wherein in a Ti concentration curve obtained by analyzing a cross section parallel to a rolling direction along a thickness direction by STEM-EDX, a lower concentration Ti layer having a Ti concentration less than an average value of Ti concentrations in the Ti concentration curve and a higher concentration Ti layer having a Ti concentration equal to or higher than the average value of the Ti concentrations in the Ti concentration curve are alternately present in a thickness direction, and wherein the titanium copper foil satisfies 1.0% by mass≤H≤30% by mass, and H/H≥1.1, in which Hand Hare as defined in the present specification.


Find Patent Forward Citations

Loading…