The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Apr. 23, 2021
Applicant:

Fluid-screen, Inc., Beverly, MA (US);

Inventors:

Slawomir Antoszczyk, Somerville, MA (US);

Monika Weber, Fredericksburg, VA (US);

Robert Weber, Dorchester, MA (US);

Assignee:

FLUID-SCREEN, INC., Beverly, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/24 (2006.01); C12Q 1/04 (2006.01); B01L 3/00 (2006.01);
U.S. Cl.
CPC ...
C12Q 1/24 (2013.01); B01L 3/502761 (2013.01); C12Q 1/04 (2013.01); B01L 2200/0647 (2013.01); B01L 2400/0424 (2013.01);
Abstract

Systems and methods are provided herein for rapid detection, separation, purification, and quantification of viral particles in a sample. According to some embodiments, a microfluidic device is provided for receiving the sample which may contain viral particles. An electrode of the microfluidic device may be used to generate dielectrophoretic (DEP) and/or electroosmotic (EO) forces acting on the sample. The applied DEP and/or EO forces may immobilize components of the sample on the surface of the electrode, may aggregate viral particles of the sample in one region of the microfluidic device, and may separate other components of the sample from the viral particles. The techniques may be performed rapidly, for example, in eight hours or less, and may not affect infectivity of the viral particles. In some embodiments, the sample may be labeled to enhance a response of one or more of the sample components to the DEP and/or EO forces.


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