The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Nov. 17, 2020
Applicant:

Fujifilm Corporation, Tokyo, JP;

Inventors:

Takeshi Hama, Ashigarakami-gun, JP;

Noboru Komori, Ashigarakami-gun, JP;

Yuki Inoue, Ashigarakami-gun, JP;

Aya Ouchi, Ashigarakami-gun, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B01L 3/00 (2006.01); G01N 33/543 (2006.01);
U.S. Cl.
CPC ...
B01L 3/502715 (2013.01); G01N 33/54366 (2013.01); B01L 2300/123 (2013.01); B01L 2400/0406 (2013.01);
Abstract

A test container including: at least two accommodation portions each accommodating a liquid and internally provided; a flow path connecting the two accommodation portions to each other at respective upper end positions thereof internally provided; and a flexible film deformable inwards of at least one accommodation portion at a portion forming an upper wall surface of the one accommodation portion, in which the liquid accommodated in the one accommodation portion is fed to the other accommodation portion via the flow path due to deformation of the flexible film towards the one accommodation portion, and a breaking elongation of the flexible film is 100% or more and 600% or less.


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