The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2023
Filed:
Nov. 30, 2021
Maxell, Ltd., Kyoto, JP;
Yuhua Zhang, Kyoto, JP;
Akihiko Kandori, Kyoto, JP;
Masayoshi Ishibashi, Kyoto, JP;
Shinya Kajiyama, Kyoto, JP;
MAXELL, LTD., Kyoto, JP;
Abstract
An object of the present invention is to provide a technique of quantitatively measuring physical properties including both viscosity and elasticity. A viscoelasticity measurement system includes a measurement apparatus, a processor, and a display apparatus. The measurement apparatus includes a movable unit continuously pressed against a measurement object, a first sensor outputting acceleration information corresponding to an acceleration of pressing-directional movement of a contact portion of the movable unit with respect to the measurement object, and a second sensor outputting reactive force information corresponding to a reactive force applied to the contact portion of the movable unit with respect to the measurement object. The processor calculates first information on an elasticity component of the measurement object and second information on a viscosity component of the measurement object based on the acceleration information and the reactive force information. The display apparatus displays the first information and the second information.