The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2023

Filed:

Jun. 03, 2019
Applicant:

Continuse Biometrics Ltd., Tel Aviv, IL;

Inventors:

Zeev Zalevsky, Rosh HaAyin, IL;

Nisim Nisan Ozana, Rehovot, IL;

Javier Garcia, Valencia, ES;

Ran Califa, Givataym, IL;

Sagi Polani, Tel-Aviv, IL;

Moshe Arie Ariel Schwarz, Bnei Brak, IL;

Hadar Genish, Petah-Tikva, IL;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B 5/026 (2006.01); A61B 5/024 (2006.01); G01N 21/88 (2006.01);
U.S. Cl.
CPC ...
A61B 5/0261 (2013.01); A61B 5/02433 (2013.01); G01N 21/8806 (2013.01);
Abstract

A system for use in monitoring application is described. The system comprises a light detection unit and an illumination arrangement. The detection unit is configured for collecting light returning from a selected inspection region for determining variations in collected light intensity. The illumination arrangement comprises one or more light sources configured for providing illumination of a selected wavelength range directed toward said inspection region. Wherein the illumination arrangement is arranged around the detection unit to provide symmetrical illumination conditions with respect to an axis connecting said detection unit and said inspection region.


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Zalevsky, Zeev. (2023). System and method for use in photoplethysmography (U.S. Patent No. 11737677). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11737677

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