The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Dec. 07, 2021
Applicant:

Palo Alto Networks, Inc., Santa Clara, CA (US);

Inventors:

Chunqing Cai, Los Altos, CA (US);

Philip Kwan, San Jose, CA (US);

Lin Wang, Palo Alto, CA (US);

Lei Chang, Saratoga, CA (US);

Sameer Kumar, Cupertino, CA (US);

Pulikeshi Ramanath, San Jose, CA (US);

Santosh Narayankhedkar, San Jose, CA (US);

Assignee:

Palo Alto Networks, Inc., Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04L 45/302 (2022.01); H04L 43/10 (2022.01);
U.S. Cl.
CPC ...
H04L 45/306 (2013.01); H04L 43/10 (2013.01);
Abstract

Techniques for enhanced Software-Defined Wide Area Network (SD-WAN) path quality measurement and selection are disclosed. In some embodiments, a system/method/computer program product for enhanced SD-WAN path quality measurement and selection includes periodically performing a network path measurement for each of a plurality of network paths at a Software-Defined Wide Area Network (SD-WAN) interface; updating a version if the network path measurement exceeds a threshold for one or more of the plurality of network paths; and selecting one of the plurality of network paths for a session based on the version according to an application policy.


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