The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Nov. 08, 2021
Vmware, Inc., Palo Alto, CA (US);
Gaurav Rastogi, San Francisco, CA (US);
Ashutosh Gupta, San Jose, CA (US);
VMWARE, INC., Palo Alto, CA (US);
Abstract
Some embodiments of the invention provide a method for collecting metric values relating to operations of a set of one or more resources executing on host computers in a datacenter. In some embodiments, the method hierarchically collects and analyzes samples, with a first set of samples collected and analyzed in the data plane, and a second set of samples collected and analyzed in the control plane by aggregating the samples collected in the data plane. In some embodiments, the data plane includes host computers on which sample collecting engines (e.g., service engines) execute, while the control plane includes a set of one or more servers that obtains sample data collected by the host computers, and aggregates and analyzes this data.