The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Dec. 29, 2022
Frontier Communications Holdings, Llc, Norwalk, CT (US);
John Valdez, Copper Canyon, TX (US);
Bryan Pauling, Rochester, NY (US);
FRONTIER COMMUNICATIONS HOLDINGS, LLC, Norwalk, CT (US);
Abstract
Techniques for identifying sources of degradations within a PON include detecting a degradation pertaining to a segment of the PON and comparing the drift over time of an optical profile of the segment with respective drifts over time of optical profiles of one or more other PON segments, where pairs of segments share respective common endpoints and an optical profile of a segment corresponds to the characteristics of optical signals delivered over the segment (e.g., attenuation, changes in frequencies, changes in power outputs, etc.). The differences between the compared drift(s) over time are utilized to narrow down the candidate components (e.g., segment endpoints, optical fibers, etc.) for the source of the degradation, and may be utilized to particularly identify a particular endpoint or optical fiber as being the source. The source of the degradation may or may not be a component of the segment to which the degradation pertained.