The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Dec. 19, 2019
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Marc Honegger, Romanshorn, CH;
Leica Instruments (Singapore) Pte. Ltd., Singapore, SG;
Abstract
A digital microscope system comprises an imaging device configured to generate digital image data representing a target region of an object, the target region being determined by a changeable setting of the imaging device; and a controller configured to generate monitor image data corresponding to the digital image data generated in accordance with the setting, the monitor image data being configured to be displayed as a monitor image; wherein the controller is further configured to change the setting in response to a user input; and wherein the controller is further configured to compensate for a delay in updating the monitor image data in accordance with the changed setting by storing the digital image data generated in accordance with the unchanged setting in response to the user input and generating simulation monitor image data by performing digital image processing on the stored digital image data taking into account the changed setting, the simulation monitor image data being configured to be displayed as a simulation monitor image during the delay.