The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Oct. 29, 2020
Zhejiang University, Zhejiang, CN;
Tao Lin, Zhejiang, CN;
Zhixian Lin, Zhejiang, CN;
Hao Jiang, Zhejiang, CN;
Yibin Ying, Zhejiang, CN;
ZHEJIANG UNIVERSITY, Zhejiang, CN;
Abstract
Disclosed is a large-scale crop phenology extraction method based on a shape model fitting method. The method comprises: acquiring a multi-year vegetation index time sequence curve in a localized geographic region; performing smooth fitting on the vegetation index time sequence curve by using a dual logistic function fitting means; establishing shape models by using reference curves and reference points of agrometeorological stations; performing shape model fitting by means of transformation; and obtaining a phenological period extraction value of the localized geographic region by means of calculation using the optimal scaling parameter. According to the present invention, macroscopic features of the curve are used, such that the influence of localized fluctuation and noise of the curve can be reduced, and a better extraction precision is obtained; and each phenological period of a crop can be extracted at the same time.