The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Jul. 14, 2021
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

David Verburg, Mantorville, MN (US);

Gábor Andorkó, Budapest, HU;

Oscar Alejandro de la Torre Del Rio, Zapopan, MX;

Richard Burton Finch, New Paltz, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 11/26 (2006.01); G06N 20/00 (2019.01); G06F 11/07 (2006.01);
U.S. Cl.
CPC ...
G06F 11/26 (2013.01); G06F 11/079 (2013.01); G06N 20/00 (2019.01);
Abstract

Aspects of the invention include receiving system data associated with a first system, the first system comprising a plurality of system components, wherein the system data comprises component data for each system component in the plurality of system components, obtaining historical performance data for each system component in the plurality of system components, determining at least one testing constraint associated with the first system, determining a test environment for the first system, the test environment comprising a plurality of test cases for the first system based on the system data, the historical performance data, and the at least one testing constraint, and executing the test environment on the first system.


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