The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Apr. 26, 2022
Applicant:

Tencent Technology (Shenzhen) Company Limited, Shenzhen, CN;

Inventors:

Xiaoyu Yu, Shenzhen, CN;

Dewei Chen, Shenzhen, CN;

Heng Zhang, Shenzhen, CN;

Yan Xiong, Shenzhen, CN;

Jianlin Gao, Shenzhen, CN;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 9/30 (2018.01); G06F 9/355 (2018.01); G06F 12/02 (2006.01);
U.S. Cl.
CPC ...
G06F 9/3016 (2013.01); G06F 9/30094 (2013.01); G06F 9/30149 (2013.01); G06F 9/355 (2013.01); G06F 12/0207 (2013.01);
Abstract

A system parses a very long instruction word (VLIW) to obtain an execution parameter. The system obtains a first sliding window width count, a first sliding window height count, a first feature map width count, and a first feature map height count that correspond to first target data. In accordance with a determination that the first sliding window width count falls within the sliding window width range, the first sliding window height count falls within the sliding window height range, (the first feature map width count falls within the feature map width range, and the first feature map height count falls within the feature map height range, the system determines an offset of the first target data. The system also obtains a starting address of the first target data, and adds the starting address to the offset to obtain a first target address of the first target data.


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