The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

May. 26, 2021
Applicant:

Nec Laboratories Europe Gmbh, Heidelberg, DE;

Inventors:

Felipe Huici, Heidelberg, DE;

Sharan Santhanam, Heidelberg, DE;

Assignee:

NEC CORPORATION, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 8/61 (2018.01); G06F 9/455 (2018.01);
U.S. Cl.
CPC ...
G06F 8/63 (2013.01); G06F 9/45558 (2013.01);
Abstract

Systems and methods for automatically generating a secure image with a reduced or minimal set of system calls (syscalls) required by an application to run. A method includes the steps of receiving as input a configuration file specifying one or more image parameters to vary; generating a set of one or more unikernel images, or experiment images, each unikernel image including a specification of how to build the image and how to run the image, each unikernel image based on one of the one or more image parameters; populating a run queue with the one or more unikernel images; and iteratively: executing each of the one or more unikernel images in a host virtual machine; and monitoring, at run-time, a usage of syscalls in the executing image to identify syscalls actually used at any point in time during the executing.


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