The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Sep. 28, 2022
Zazzle Inc., Menlo Park, CA (US);
Young Leslie Harvill, Olympia, WA (US);
ZAZZLE INC., Menlo Park, CA (US);
Abstract
In some implementations, a method for custom fitting and manufacturing parametric products comprises generating a plurality of parametric 3D models of a custom product based on past learned data pertaining to the custom product; generating a first user interface comprising at least a first graphical representation of the custom product; receiving a plurality of adjustment 3D parameters for improving a fit of the custom product in relation to user-specific data; determining two particular parametric 3D models of the plurality of parametric 3D models, each having at least one 3D parameter, of the plurality of corresponding 3D parameters, that is within a particular tolerance of at least one 3D parameter of the plurality of adjustment 3D parameters; generating a parametric 3D fit model having a plurality of 3D fit model parameters by interpolating, for the at least one parameter of the two particular parametric 3D models, between a plurality of corresponding 3D control points of a first parametric 3D model and a plurality of corresponding 3D control points of a second parametric 3D model of the two particular parametric 3D models; transmitting the parametric 3D fit model to a manufacturer to cause the manufacturer to produce a parametric physical product based on the plurality of 3D fit model parameters of the parametric 3D fit model.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile