The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Sep. 28, 2022
Applicant:

Zazzle Inc., Menlo Park, CA (US);

Inventor:

Young Leslie Harvill, Olympia, WA (US);

Assignee:

ZAZZLE INC., Menlo Park, CA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/04847 (2022.01); G06T 17/00 (2006.01); G06F 3/14 (2006.01); G06F 3/04845 (2022.01); G06F 3/04815 (2022.01); G06Q 30/0601 (2023.01); G05B 13/04 (2006.01); G06Q 50/04 (2012.01); G06F 3/04842 (2022.01);
U.S. Cl.
CPC ...
G06F 3/04847 (2013.01); G05B 13/042 (2013.01); G06F 3/04815 (2013.01); G06F 3/04845 (2013.01); G06F 3/1454 (2013.01); G06Q 30/0621 (2013.01); G06Q 30/0643 (2013.01); G06Q 50/04 (2013.01); G06T 17/00 (2013.01); G06F 3/04842 (2013.01); G06F 2203/04803 (2013.01); G06T 2200/24 (2013.01);
Abstract

In some implementations, a method for custom fitting and manufacturing parametric products comprises generating a plurality of parametric 3D models of a custom product based on past learned data pertaining to the custom product; generating a first user interface comprising at least a first graphical representation of the custom product; receiving a plurality of adjustment 3D parameters for improving a fit of the custom product in relation to user-specific data; determining two particular parametric 3D models of the plurality of parametric 3D models, each having at least one 3D parameter, of the plurality of corresponding 3D parameters, that is within a particular tolerance of at least one 3D parameter of the plurality of adjustment 3D parameters; generating a parametric 3D fit model having a plurality of 3D fit model parameters by interpolating, for the at least one parameter of the two particular parametric 3D models, between a plurality of corresponding 3D control points of a first parametric 3D model and a plurality of corresponding 3D control points of a second parametric 3D model of the two particular parametric 3D models; transmitting the parametric 3D fit model to a manufacturer to cause the manufacturer to produce a parametric physical product based on the plurality of 3D fit model parameters of the parametric 3D fit model.


Find Patent Forward Citations

Harvill, Young. (2023). Parametric modelling and grading (U.S. Patent No. 11733853). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733853

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…