The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Sep. 28, 2021
Applicant:

Samsung Display Co., Ltd., Yongin-Si, KR;

Inventors:

Bongil Kang, Namyangju-si, KR;

Sangkook Kim, Cheonan-si, KR;

Gayeon Yun, Seoul, KR;

Assignee:

SAMSUNG DISPLAY CO., LTD., Yongin-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 3/041 (2006.01); G06F 3/044 (2006.01); G01R 27/26 (2006.01);
U.S. Cl.
CPC ...
G06F 3/0412 (2013.01); G01R 27/2605 (2013.01); G06F 3/0443 (2019.05); G06F 3/0446 (2019.05); G06F 3/0447 (2019.05); G06F 3/04164 (2019.05); G06F 2203/04111 (2013.01);
Abstract

A method of testing an electronic device includes providing an electronic device. The electronic device includes a display layer that includes a common electrode. The electronic device also includes a sensor layer disposed on the display layer and that includes a first sensing electrode and a second sensing electrode. The first sensing electrode and the second sensing electrode cross each other and are electrically disconnected. The method further includes providing a test signal that includes a test frequency to the first sensing electrode, measuring a capacitance of a capacitor disposed between the first and second sensing electrodes based on the test signal, and testing the common electrode based on the capacitance.


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