The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Sep. 30, 2020
Gist(gwangju Institute of Science and Technology), Gwangju, KR;
Sun Kyu Lee, Gwangju, KR;
Dae Gweon Koh, Gwangju, KR;
Han Ul Kim, Gwangju, KR;
Jin Hyuk Hong, Gwangju, KR;
Dinuka Ravimal Ranawaka Arachchige, Gwangju, KR;
GIST(Gwangju Institute of Science and Technology), Gwangju, KR;
Abstract
The present disclosure relates to a surface inspection method using a mold surface inspection device, and more specifically, to a surface inspection method using a mold surface inspection device including a setting part in which an inspection object is set, a light source part configured to irradiate the inspection object with irradiated light so that a reflective highlight is generated on a surface of the inspection object, an imaging part configured to image the surface of the inspection object so that a highlight region where a reflective highlight is generated is included, and an image processing part configured to process an image imaged in the imaging part to provide the image to a worker so that the worker determines whether defects are generated on the surface of the inspection object on the basis of the image.