The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Dec. 15, 2020
Applicant:
Inscopix, Inc., Palo Alto, CA (US);
Inventors:
Mark Trulson, San Jose, CA (US);
Koen Visscher, Tucson, AZ (US);
Kevin E. Newman, Palo Alto, CA (US);
Assignee:
INSCOPIX INC., Palo Alto, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 21/18 (2006.01); G02B 27/00 (2006.01); G02B 21/02 (2006.01); G02B 19/00 (2006.01); G02B 21/24 (2006.01); G02B 21/36 (2006.01);
U.S. Cl.
CPC ...
G02B 21/18 (2013.01); G02B 19/0014 (2013.01); G02B 19/0066 (2013.01); G02B 21/02 (2013.01); G02B 21/241 (2013.01); G02B 21/361 (2013.01); G02B 21/367 (2013.01); G02B 27/0037 (2013.01);
Abstract
Provided herein are systems and methods for multi-color imaging using a microscope system. The microscope system can have a relatively small size compared to an average microscope system. The microscope system can comprise various components configured to reduce or eliminate image artifacts such as chromatic aberrations and/or noise from stray light that can occur during multi-color imaging. The components can be configured to reduce or eliminate the image artifacts, and/or noise without substantially changing the size of the microscope system.