The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Apr. 16, 2019
Applicant:
Fanuc Corporation, Yamanashi, JP;
Inventors:
Assignee:
FANUC CORPORATION, Yamanashi, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01S 7/499 (2006.01); G01B 11/14 (2006.01); G01V 8/14 (2006.01); G01S 7/481 (2006.01); G01S 17/08 (2006.01); G01S 17/04 (2020.01);
U.S. Cl.
CPC ...
G01S 7/499 (2013.01); G01B 11/14 (2013.01); G01S 7/4816 (2013.01); G01S 17/04 (2020.01); G01S 17/08 (2013.01); G01V 8/14 (2013.01);
Abstract
A distance-measuring apparatus includes an optical window incorporating a first polarizing filter that polarizes reference light and a second polarizing filter that polarizes incident light in a direction inclined at 90 degrees relative to a polarization direction of the first polarizing filter.
Takahashi, Yuuki. (2023). Distance measuring apparatus comprising deterioration determination of polarizing filters based on a reflected polarized intensity from a reference reflector (U.S. Patent No. 11733362). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733362
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile