The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
May. 24, 2022
Applicant:
Airbus Helicopters, Marignane, FR;
Inventors:
Laurent Bianchi, Marseilles, FR;
Sebastien Bernier, Pertuis, FR;
John Enderby, Bristol, GB;
Mark Bowes, Carmarthenshire, GB;
Dawood Parker, Whitland, GB;
Assignee:
AIRBUS HELICOPTERS, Marignane, FR;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 29/08 (2006.01); G01R 31/00 (2006.01); G01R 1/07 (2006.01); G01N 27/24 (2006.01);
U.S. Cl.
CPC ...
G01R 29/0878 (2013.01); G01N 27/24 (2013.01); G01R 1/07 (2013.01); G01R 31/002 (2013.01);
Abstract
A probe for non-intrusively detecting imperfections in a test object made from metallic, non-conductive, and/or composite materials. The probe may include a capacitive measuring apparatus that includes at least two coplanar electrodes, an adjustment device to adjust a spatial separation between the electrodes, and a separation device. The separation device may maintain a substantially constant distance between the at least two coplanar electrodes and the test object during test measurements.