The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Jul. 21, 2021
Applicant:

Rohde & Schwarz Gmbh & Co. KG, Munich, DE;

Inventors:

Franz Strasser, Niclasreuth, DE;

Andreas Ziegler, Munich, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R 1/04 (2006.01); G01R 1/067 (2006.01); G01R 1/073 (2006.01); A61B 8/14 (2006.01); A61B 5/00 (2006.01); A61B 5/05 (2021.01); A61B 5/06 (2006.01); G01R 1/18 (2006.01); H01F 7/02 (2006.01); H01B 7/04 (2006.01); H01B 11/18 (2006.01);
U.S. Cl.
CPC ...
G01R 1/06705 (2013.01); G01R 1/06772 (2013.01); G01R 1/18 (2013.01); H01B 7/04 (2013.01); H01B 11/1895 (2013.01); H01F 7/02 (2013.01);
Abstract

The present disclosure provides a probe cable assembly comprising a probe interface configured to couple to a measurement interface and to receive a differential signal, a measurement output interface configured to output the differential signal, and a cable arrangement electrically arranged between the probe interface and the measurement output interface and configured to conduct the differential signal between the probe interface and the measurement output interface, the cable arrangement comprising a cable, a plurality of magnetic elements arranged around at least a section of the length of the cable, wherein each magnetic element is separated by a gap from adjacent magnetic elements, and a plastically deformable guiding element configured to fix the cable arrangement with a predetermined relative position between the probe interface and the measurement output interface.


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