The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Sep. 30, 2022
Applicant:

United Arab Emirates Universtiy, Al Ain, AE;

Inventors:

Waleed Khalil Ahmed, Al Ain, AE;

Muthanna Ahmed Aziz, Al Ain, AE;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/24 (2006.01); G01N 35/00 (2006.01); B25J 18/00 (2006.01);
U.S. Cl.
CPC ...
G01N 35/0099 (2013.01); B25J 18/00 (2013.01); G01B 21/24 (2013.01); G01N 35/00613 (2013.01);
Abstract

An interlock system for an industrial inspection system. The interlock system includes a first interlock mechanism having a projection that has an internal thread extending into the projection; and a second interlock mechanism having a receiving member that receives the projection. The second interlock mechanism has a threaded shaft that extends into the internal thread of the first interlock mechanism when rotated. The second interlock mechanism moves toward the first interlock mechanism when the threaded shaft is rotated.


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Ahmed, Waleed. (2023). Industrial inspection system with interlock (U.S. Patent No. 11733255). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733255

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