The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Jan. 29, 2021
Applicant:
Applied Materials, Inc., Santa Clara, CA (US);
Inventor:
Asaf Schlezinger, Modi'in, IL;
Assignee:
Applied Materials, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G01N 21/956 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9508 (2013.01); G01N 21/8851 (2013.01); G06T 7/001 (2013.01); G01N 2021/95615 (2013.01); G06T 2207/30108 (2013.01);
Abstract
Embodiments of the present disclosure are directed to a system and method for the inspection of products, such as tablets, pills, capsules, caplets, softgels, and other discreet units of consumption that may be ingested by a user. In embodiments, a plurality of cameras are used to capture images of the surface of the product. The images are aggregated to a single file and the imaged product features are analyzed for compliance to a product standard.
Schlezinger, Asaf. (2023). Method and system for inspection of products (U.S. Patent No. 11733178). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11733178
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile