The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Jun. 22, 2020
Applicant:
Korea Advanced Institute of Science and Technology, Daejeon, KR;
Inventors:
Hansuek Lee, Daejeon, KR;
Yeseul Kim, Daejeon, KR;
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/552 (2014.01); G01N 21/76 (2006.01); G01N 21/77 (2006.01); G01N 33/53 (2006.01);
U.S. Cl.
CPC ...
G01N 21/553 (2013.01); G01N 21/554 (2013.01); G01N 21/76 (2013.01); G01N 21/77 (2013.01); G01N 33/53 (2013.01); G01N 2021/7789 (2013.01); G01N 2201/062 (2013.01);
Abstract
Disclosed herein is a method of determining a concentration of a subject based on fraction bound measurement. The method of determining a concentration of a subject based on fraction bound measurement may include fixing a ligand to a surface of an optical device, measuring a fraction bound of a subject to be detected based on an optical signal when the subject reacts to the ligand fixed to the surface of the optical device, and determining a relative value of a concentration of the subject based on a ratio of measured values of the fraction bounds of the subject and a reference signal.