The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Aug. 07, 2020
Kansas State University Research Foundation, Manhattan, KS (US);
Mir Seliman Waez, San Antonio, TX (US);
Christopher Sorensen, Manhattan, KS (US);
Steven Eckels, Manhattan, KS (US);
Kansas State University Research Foundation, Manhattan, KS (US);
Abstract
Apparatus and methods for determining particle size, and optionally, the complex index of refraction for particle suspended in a gas or liquid are provided. The particle to be analyzed is caused to travel through a laser beam having a modified Gaussian profile. The particle causes light from the laser beam to scatter. The scattered light is measured by one or more photodetectors disposed at a particular scattering angle relative to the center of the laser beam. The apparatus and methods can be used in sensors configured to monitor air quality in enclosed environments, such as on-board aircraft and within buildings, and/or detect environmental contaminants.