The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Dec. 23, 2021
Applicant:

Shanghai Jiao Tong University, Shanghai, CN;

Inventors:

Liangjun Lu, Shanghai, CN;

Junjie Du, Shanghai, CN;

Linjie Zhou, Shanghai, CN;

Jianping Chen, Shanghai, CN;

Jiao Liu, Shanghai, CN;

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J 3/45 (2006.01); G01J 3/18 (2006.01);
U.S. Cl.
CPC ...
G01J 3/45 (2013.01); G01J 3/1895 (2013.01);
Abstract

A silicon Fourier transform spectrometer and an optical spectrum reconstruction method are disclosed. The spectrometer includes a waveguide input coupler, cascaded optical switches, unbalanced subwavelength grating (SWG) waveguide pairs, and a germanium silicon detector, where the cascaded optical switches are connected through unbalanced SWG waveguide pairs. The state of the optical switches are adjusted to digitally configure the optical path, so as to constitute a series of unbalanced Mach-Zehnder interferometer (MZI) arrays with different optical path differences, to realize a Fourier transform spectrometer based on spatial heterodyne. The optical spectrum is reconstructed by using a compressed sensing algorithm.


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