The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Mar. 08, 2021
Applicant:

Dai Nippon Printing Co., Ltd., Tokyo, JP;

Inventors:

Hideyuki Okamoto, Tokyo, JP;

Chikao Ikenaga, Tokyo, JP;

Yoshihiro Baba, Tokyo, JP;

Daigo Aoki, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C23C 14/52 (2006.01); C23C 14/04 (2006.01); H10K 71/00 (2023.01);
U.S. Cl.
CPC ...
C23C 14/52 (2013.01); C23C 14/042 (2013.01); H10K 71/00 (2023.02); Y10T 29/49826 (2015.01); Y10T 29/49863 (2015.01);
Abstract

A standard mask apparatus includes at least one standard mask including at least one through-hole. The standard mask apparatus may include standard regions each including the at least one through-hole. The standard regions may be arranged in a first direction and in a second direction that intersects with the first direction. A ratio of a dimension of each standard region in the first direction to a dimension of an interval between two of the standard regions in the first direction may be higher than or equal to 0.1. A ratio of a dimension of each standard region in the second direction to a dimension of an interval between the two standard regions in the second direction may be higher than or equal to 0.1.


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