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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 11731365 B1

PDFFull Text
Date of Patent:
Aug. 22, 2023

Filed:

Apr. 25, 2017

Calibration method of plurality of scanners in an additive manufacturing apparatus

Applicant:

Renishaw Plc, Wotton-under-Edge, GB;

Inventor:

Ceri Brown, Plaisance-du-Touch, FR;

Assignee:

RENISHAW PLC, Wotton-under-Edge, GB;

Attorney:

Oliff PLC

Primary Examiner:

Thomas C Lee

Assistant Examiner:

Charles Cai

Int. Cl.
CPC ...
B29C 64/393 (2017.01); B33Y 10/00 (2015.01); B33Y 50/02 (2015.01); B33Y 30/00 (2015.01); B29C 64/153 (2017.01); B29C 64/20 (2017.01); B22F 10/28 (2021.01); B22F 12/45 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B22F 10/31 (2021.01); B22F 10/366 (2021.01);
U.S. Cl.
CPC ...
B29C 64/393 (2017.08); B22F 10/28 (2021.01); B22F 10/31 (2021.01); B22F 10/366 (2021.01); B22F 12/45 (2021.01); B22F 12/49 (2021.01); B22F 12/90 (2021.01); B29C 64/153 (2017.08); B29C 64/20 (2017.08); B33Y 10/00 (2014.12); B33Y 30/00 (2014.12); B33Y 50/02 (2014.12); Y02P 10/25 (2015.11);
Abstract

A method for determining an attribute of an additive manufacturing apparatus including a plurality of scanners, each scanner including beam steering optics for directing a corresponding radiation beam to a working plane in which material consolidated in layers. The method may include controlling the beam steering optics of a pair of the scanners wherein a first scanner of the pair directs a radiation beam to form a feature in the working plane. The feature is within a field of view of a detector of the second scanner of the pair, the detecting radiation from the working plane is collected by the beam steering optics of the second scanner. Further including recording at least one detector value with the detector of the second scanner for the field of view and determining an attribute of the additive manufacturing apparatus from a comparison of the detector value with an expected detector value.

Find Patent Forward Citations

Brown, Ceri. (2023). Calibration method of plurality of scanners in an additive manufacturing apparatus (U.S. Patent No. 11731365). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/11731365

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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