The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Oct. 16, 2018
Applicant:

Koninklijke Philips N.v., Eindhoven, NL;

Inventors:

Ji Cao, Bothell, WA (US);

Patrick Lambert, Bothell, WA (US);

Mark Potts, Seattle, WA (US);

Assignee:

KONINKLIJKE PHILIPS N.V., Eindhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 8/00 (2006.01); A61B 8/14 (2006.01);
U.S. Cl.
CPC ...
A61B 8/58 (2013.01); A61B 8/145 (2013.01);
Abstract

An ultrasound probe is tested for failure of 5 elements of its array transducer by operating the probe with its lens in contact with the air. The echo signals produced during this mode of operation are beamformed into the usual set of scanlines produced by the probe. The frequency response of 10 each scanline is analyzed and compared with a reference signal of the frequency response of the corresponding scanline of a known good probe of the same type as the probe under test. If a comparison reveals a variance greater than a predetermined 15 deviation, the user is alerted that the probe should be replaced.


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