The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2023

Filed:

Jun. 28, 2021
Applicant:

Equi-nom Ltd., Kibbutz Givat Brenner, IL;

Inventors:

Itay Zemach, Rehovot, IL;

Menachem Sklarz, Beer Sheva, IL;

Oswald Crasta, Lubbock, TX (US);

Assignee:

EQUI-NOM LTD, Kibbutz Givat Brenner, IL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A01H 6/66 (2018.01); A01H 5/10 (2018.01);
U.S. Cl.
CPC ...
A01H 6/66 (2018.05); A01H 5/10 (2013.01);
Abstract

High yield sesame plants and parts thereof are provided. Phenotypic and genotypic analysis of many sesame varieties was performed to derive markers for phenotypic traits that contribute to high yield, and a breeding simulation was used to identify the most common and most stable markers. Examples for such phenotypic traits include the number of capsules per leaf axil, the capsule length, the height to first capsule and the number of lateral shoots. Following verification of trait stability over several generations, markers and marker cassettes were defined as being uniquely present in the developed sesame lines. The resulting high yield, shatter-resistant sesame lines can be used to increase sesame yield for its various uses.


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