The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2023
Filed:
Jan. 27, 2022
Cnh Industrial America Llc, New Holland, PA (US);
Luca Ferrari, Modena, IT;
John H. Posselius, Ephrata, PA (US);
CNH INDUSTRIAL AMERICA LLC, New Holland, PA (US);
Abstract
A method for estimating and adjusting crop residue parameters may include controlling an operation of a tillage implement as the implement is being towed by a work vehicle across the field to perform a tillage operation and receiving a pre-tilled image of an imaged portion of the field located to one side of a first section of the field as the implement is being towed across the first section of the field. The method may also include receiving a post-tilled image of the imaged portion of the field as the implement is being towed across the field, analyzing the pre-tilled and post-tilled images of the imaged portion of the field to estimate a crop residue parameter for the field, and, when the estimated parameter differs from a target associated with such parameter, actively adjusting the operation of the tillage implement in a manner designed to adjust the crop residue parameter.