The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Feb. 07, 2022
The Bank of New York Mellon, New York, NY (US);
Badri Mangalam, New York, NY (US);
Sridhar Seetharaman, New York, NY (US);
Lakshmi Thiruvengadathan, New York, NY (US);
THE BANK OF NEW YORK MELLON, New York, NY (US);
Abstract
Provided is an architecture drift detection system and method including: obtaining a first set of architecture design metrics associated with a first application; obtaining first set of data metrics associated with a first instance of the first application that is installed at a first server computing system; obtaining a second set of data metrics associated with a second instance of the first application that is installed at a second server computing system; determining, using the first set of data metrics and the second set of data metrics, that at least one of the first instance, the first server computing system, the second instance, or the second server computing system deviates from one or more architecture design metrics from the first set of architecture design metrics associated with the first application; and providing a deviation notification indicating a deviation from the one or more architecture design metrics.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile