The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Jun. 10, 2022
Fg Innovation Company Limited, Tuen Mun, HK;
Chia-Hao Yu, Taipei, TW;
Chia-Hung Wei, Taipei, TW;
Yu-Hsin Cheng, Taipei, TW;
Tsung-Hua Tsai, Taipei, TW;
FG Innovation Company Limited, Tuen Mun, HK;
Abstract
A method for SCell BFR performed by a BS is provided. The method includes: receiving, from a UE, a BFR MAC CE that includes a cell index of an SCell for which a beam failure is detected, and a reference signal index for the SCell, the BFR MAC CE is transmitted, by the UE, via a UL transmission associated with a HARQ process having a HARQ process ID; and transmitting, to the UE, DCI that schedules a PUSCH transmission with the HARQ process ID of the HARQ process that is used for the UL transmission of the BFR MAC CE, the DCI indicating a toggled NDI value, wherein the UE is configured to: determine, upon receiving the DCI, that the SCell BFR procedure is successfully completed; and monitor, on the SCell, a PDCCH using antenna port quasi-colocation parameters associated with the reference signal index after receiving the DCI.