The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jan. 13, 2022
Applicant:

Wisconsin Alumni Research Foundation, Madison, WI (US);

Inventors:

Michael Scott Westphall, Fitchburg, WI (US);

Joshua Jacques Coon, Middleton, WI (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 1/42 (2006.01); H01J 49/04 (2006.01); H01J 49/00 (2006.01); H01J 49/06 (2006.01);
U.S. Cl.
CPC ...
H01J 49/0004 (2013.01); G01N 1/42 (2013.01); H01J 49/04 (2013.01); H01J 49/0468 (2013.01); H01J 49/0486 (2013.01); H01J 49/0495 (2013.01); H01J 49/062 (2013.01);
Abstract

Imaging by cryo-electron microscopy (cryo-EM) requires that a sample be encased in an amorphous solid, such as amorphous ice. In current cryo-EM preparation systems, once the sample has been deposited on an EM grid and coated in the amorphous solid, the EM grid must be removed from vacuum and then transferred into the vacuum of the cryo-EM system. As a result, samples deposited on the grid are exposed to damage and contamination. The present invention provides improved EM grid handling systems and devices compatible with advanced cryo-EM sample preparation techniques and which reduce or eliminate exposure of the sample on the grid to atmosphere and elevated temperatures. These methods and devices will also significantly reduce handling time and complexities associated with cryo-EM sample preparation.


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