The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Apr. 21, 2020
Sartorius Bioanalytical Instruments, Inc., Bohemia, NY (US);
Timothy Jackson, Ann Arbor, MI (US);
Nevine Holtz, Ann Arbor, MI (US);
Sartorius BioAnalytical Instruments, Inc., Bohemia, NY (US);
Abstract
Methods are provided to project depth-spanning stacks of limited depth-of-field images of a sample into a single image of the sample that can provide in-focus image information about three-dimensional contents of the image. These methods include applying filters to the stacks of images in order to identify pixels within each image that have been captured in focus. These in-focus pixels are then combined to provide the single image of the sample. Filtering of such image stacks can also allow for the determination of depth maps or other geometric information about contents of the sample. Such depth information can also be used to inform segmentation of images of the sample, e.g., by further dividing identified regions that correspond to the contents of the sample at multiple different depths.