The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Dec. 19, 2022
Applicant:

Siemens Healthcare Gmbh, Erlangen, DE;

Inventor:

Alois Regensburger, Poxdorf, DE;

Assignee:

Siemens Healthcare GmbH, Erlangen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T 7/00 (2017.01); G06V 10/24 (2022.01); G06V 10/82 (2022.01); G06V 10/74 (2022.01);
U.S. Cl.
CPC ...
G06T 7/0012 (2013.01); G06V 10/24 (2022.01); G06V 10/761 (2022.01); G06V 10/82 (2022.01); G06T 2207/10116 (2013.01);
Abstract

A method for generating synthetic X-ray images is provided. A first neural network is provided to generate at least one synthetic X-ray image having specified quality. A second neural network is provided to ascertain characterizing properties from at least one secondary X-ray image for the first neural network. The first neural network and the second neural network may be trained by primary X-ray images of specified minimum quality. The at least one secondary X-ray image has a lower quality compared to primary X-ray images. The at least one synthetic X-ray image is generated with the aid of the provided characterizing properties by the first neural network. The at least one synthetic X-ray image is improved with regard to quality compared to the at least one secondary X-ray image.


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