The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2023

Filed:

Jul. 21, 2017
Applicant:

Sap SE, Walldorf, DE;

Inventors:

Bingshui Da, Singapore, SG;

Chen Wang, Singapore, SG;

Yew Soon Ong, Singapore, SG;

Abhishek Gupta, Singapore, SG;

Assignee:

SAP SE, Walldorf, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 7/14 (2006.01); G06F 16/28 (2019.01); G06N 7/01 (2023.01);
U.S. Cl.
CPC ...
G06N 20/00 (2019.01); G06F 7/14 (2013.01); G06F 16/285 (2019.01); G06N 7/01 (2023.01);
Abstract

Methods, systems, and computer-readable storage media for receiving a dataset, the dataset including a plurality of data values, clustering data values of the plurality of data values into a plurality of input feature clusters in input feature space, training a local multi-task Gaussian process (MTGP) for each input feature cluster to provide optimized hyper-parameters in hyper-parameter space, an optimized hyper-parameter being provided for each input feature cluster, merging data values based on the optimized hyper-parameters, and distances between hyper-parameter clusters in the hyper-parameter space to provide a plurality of merged data values, and providing a LL-MTGP model based on the merged data values.


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