The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2023
Filed:
Apr. 28, 2022
Applicant:
Splunk Inc., San Francisco, CA (US);
Inventors:
Mayank Agarwal, Mountain View, CA (US);
Steven Karis, Redwood City, CA (US);
Justin Smith, San Francisco, CA (US);
Assignee:
SPLUNK Inc., San Francisco, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/36 (2006.01); G06F 3/0482 (2013.01); G06Q 10/0639 (2023.01); G06F 9/22 (2006.01);
U.S. Cl.
CPC ...
G06F 11/3616 (2013.01); G06F 3/0482 (2013.01); G06F 11/3636 (2013.01); G06F 11/3664 (2013.01); G06Q 10/06395 (2013.01); G06F 9/22 (2013.01);
Abstract
Monitoring and troubleshooting tools provide the capability to visualize different levels of a client's application that is deployed as a suite of independent but cooperating services (e.g., as microservices of a microservices-based architecture), collect values of monitored or tracked metrics at those different levels, and visualize values of the metrics at those levels. For example, metrics values can be generated for teams of the microservices.